Internal Test Pattern Generator

The Genie Nano 10G camera includes internal test patterns which easily confirm camera installations, without the need for a camera lens or proper lighting.

Use CamExpert to easily enable and select the any of the available test patterns. Select Grab to see the pattern output.

Note that internal test patterns are generated by the camera FPGA where the patterns are inserted immediately after the sensor output in the processing chain and are the same maximum bit depth as the sensor. The patterns are identical for monochrome or color camera models and subject to processing operations.

NOTE
Selecting the camera 8-bit output format displays the lower 8-bits of the processing path.

Available Test Patterns

Grey Horizontal Ramp

Image is filled horizontally with an image that goes from the darkest value to the brightest value.

Grey Diagonal Ramp Moving

Image is filled diagonally from darkest to brightest value and moves horizontally from right to left by 1 pixel between frames. This is a good pattern to indicate motion when doing a continuous grab.

NOTE
When an internal test pattern is selected, the Metadata feature values for Exposure Time and Exposure Delay are not valid and must be ignored.